منابع مشابه
designing a fast locking pll
a phase-locked loop (pll) based frequency synthesizer is an important circuit that is used in many applications, especially in communication systems such as ethernet receivers, disk drive read/write channels, digital mobile receivers, high-speed memory interfaces, system clock recovery and wireless communication system. other than requiring good signal purity such as low phase noise and low spu...
Introducton to EBIC
In a semiconductor either electrons or holes typically dominate as dictated by the concentration of ionized dopants, and the nomenclature is n type for electrons dominating and p type for holes. Minority carriers are therefore holes in n type and electrons in p type. Electron-hole pair generation is a local disturbance from the equilibrium concentration. As electron hole pairs are formed, the d...
متن کاملEBIC investigations of thick SOI layers
2014 Thick SOI layers obtained by zone melting with and without seeds, respectively, have been investigated by EBIC with respect to their electrical properties (electrical homogeneity, electrically active defects, minority-carrier diffusion length). A variety of inhomogeneities being partly of complex origin has been observed. Their formation is affected by existence of seeds. Besides usual dar...
متن کاملA pipette-based calibration system for fast-scan cyclic voltammetry with fast response times.
Fast-scan cyclic voltammetry (FSCV) is an electrochemical technique that utilizes the oxidation and/or reduction of an analyte of interest to infer rapid changes in concentrations. In order to calibrate the resulting oxidative or reductive current, known concentrations of an analyte must be introduced under controlled settings. Here, I describe a simple and cost-effective method, using a Petri ...
متن کاملVoltage Contrast and EBIC Failure Isolation Techniques
Failure analysis challenges have increased as electronic circuit capability and complexity of integrated circuits evolve to higher densities and smaller feature sizes. Despite this evolution, “old school” tools can be effective in solving problems on both simple and complex devices. In particular, when Voltage Contrast (VC) and Electron Beam Induced Current (EBIC) are combined together results ...
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ژورنال
عنوان ژورنال: Australian Journal of Physics
سال: 1983
ISSN: 0004-9506
DOI: 10.1071/ph830565